供应DSA8200 采样示波器,DSA8200 采样示波器供货期-仪表网

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为挑战的系统设计提供信号高保真度
当前高速电路使得信号路径检定和BER分析的挑战性进一步提高。由于的TDR带宽、速的S参数测量功能及全面支持光学标准测试，DSA8200数字串行分析仪提供了完整的高速物理层测试平台。

DSA8200采样示波器概述

功能	优点
最多4个真实差分通道	利用真实的差分TDR激励信号准确地检测非线性设备，如放大器。
高带宽（50 GHz）时域反射仪	以12 ps 的入射级将阻抗不连续性分解至 1mm。
光学模块噪声低，光学灵敏度高，拥有消光比校准功能及宽波长。	通过一个光学测试解决方案，满足8.5Gb/s - 40Gb/s所有主要标准。
IConnect® 信号完整性	利用集成的TDR和S参数测量减少由测试治具信号降级引起的测量错误。
串行数据网络分析 (SDNA)	通过一个仪器进行时域和频域分析来降低测试成本。准确地分析信号通路以预测信号串扰和抖动，确保可靠的系统运行。
串行数据链路分析 (SDLA)	通过抖动、噪声和BER分析确定眼闭的准确原因。通过快速评估各种FE/DFE均衡设置接收器的眼睁时间。
远程采样头	通过将TDR头接近被测试设备来优化信号保真度和最小化探头、电缆及测试治具的影响。

Provide signal high fidelity for the most challenging system design

The current high speed circuit makes the signal path verification and BER analysis more challenging. Because of the highest TDR bandwidth, the fastest S parameter measurement function and the comprehensive support of optical standard test, DSA8200 digital serial analyzer provides a complete high-speed physical layer test platform.

DSA8200 sampling oscilloscope

Provide signal high fidelity for the most challenging system design

Today's high-speed design makes channel characterization and BER performance analysis more difficult than ever.

With the highest TDR (time domain reflectometer) bandwidth, the fastest S parameter measurement, and the most comprehensive analysis tools, DSA8200 digital serial analyzer provides a comprehensive solution to network and link analysis.

function

advantages

Up to 4 real difference channels use real difference TDR excitation signals to accurately detect non-linear devices such as amplifiers.

The high-bandwidth (50 GHz) time-domain reflector decomposes the impedance discontinuity to 1mm at an incident level of 12 ps.

IConnect? Signal integrity USES integrated TDR and S parameter measurements to reduce measurement errors caused by signal degradation of test fixture.

Serial data network analysis (SDNA) reduces test costs by using an instrument for time - and frequency-domain analysis.

Accurately analyze the signal path to predict signal crosstalk and jitter and ensure reliable system operation.

Serial data link analysis (SDLA) determines the exact cause of eye closure through jitter, noise and BER analysis.

By quickly evaluating the eye-opening time of various FE/DFE equalization Settings receiver.

The remote sampling head optimizes signal fidelity and minimizes the impact of probes, cables and test fixtures by bringing the TDR head close to the device being tested.

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